3819 search results - page 140 / 764 » Predicting Dependability by Testing |
DT
2006
13 years 8 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
PAKDD
2004
ACM
14 years 1 months ago
2004
ACM
This paper presents a new prediction model for predicting when an online customer leaves a current page and which next Web page the customer will visit. The model can forecast the ...
ICRA
2002
IEEE
14 years 29 days ago
2002
IEEE
We test the hypothesis that: (1) Optic flow can be used to detect significant environmental features during locomotion in a biped, even given significant up and down movement and j...
JCC
2008
13 years 8 months ago
2008
: We introduce PULCHRA, a fast and robust method for the reconstruction of full-atom protein models starting from a reduced protein representation. The algorithm is particularly su...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...