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» Predicting faults using the complexity of code changes
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126
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INFOCOM
2009
IEEE
15 years 9 months ago
Rateless Coding with Feedback
The erasure resilience of rateless codes, such as Luby-Transform (LT) codes, makes them particularly suitable to a wide variety of loss-prone wireless and sensor network applicati...
Andrew Hagedorn, Sachin Agarwal, David Starobinski...
ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 6 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
123
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DAC
2007
ACM
16 years 3 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
125
Voted
GECCO
2007
Springer
162views Optimization» more  GECCO 2007»
15 years 8 months ago
Some novel locality results for the blob code spanning tree representation
The Blob Code is a bijective tree code that represents each tree on n labelled vertices as a string of n − 2 vertex labels. In recent years, several researchers have deployed th...
Tim Paulden, David K. Smith
124
Voted
IWPSE
2007
IEEE
15 years 8 months ago
Talking tests: an empirical assessment of the role of fit acceptance tests in clarifying requirements
The starting point for software evolution is usually a change request, expressing the new or updated requirements on the delivered system. The requirements specified in a change ...
Filippo Ricca, Marco Torchiano, Mariano Ceccato, P...