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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 4 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
KBSE
2007
IEEE
14 years 4 months ago
Modeling bug report quality
Software developers spend a significant portion of their resources handling user-submitted bug reports. For software that is widely deployed, the number of bug reports typically ...
Pieter Hooimeijer, Westley Weimer
IWMM
2004
Springer
98views Hardware» more  IWMM 2004»
14 years 3 months ago
Dynamic object sampling for pretenuring
Many state-of-the-art garbage collectors are generational, collecting the young nursery objects more frequently than old objects. These collectors perform well because young objec...
Maria Jump, Stephen M. Blackburn, Kathryn S. McKin...
CGO
2003
IEEE
14 years 3 months ago
Compiler Optimization-Space Exploration
To meet the performance demands of modern architectures, compilers incorporate an everincreasing number of aggressive code transformations. Since most of these transformations are...
Spyridon Triantafyllis, Manish Vachharajani, Neil ...
HICSS
2003
IEEE
215views Biometrics» more  HICSS 2003»
14 years 3 months ago
A Field Study of Use of Synchronous Chat in Online Courses
A field study of Computer Mediated Communication (CMC) as used in higher education asks the questions, "Will students take part in synchronous chat sessions if they are sched...
David H. Spencer, Starr Roxanne Hiltz