37 search results - page 5 / 8 » Prediction of Power Requirements for High-Speed Circuits |
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
TC
2008
13 years 7 months ago
2008
This paper describes a new on-demand wake-up prediction policy for reducing leakage power. The key insight is that branch prediction can be used to selectively wake up only the nee...
ASPDAC
2011
ACM
12 years 11 months ago
2011
ACM
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Straining of silicon improves mobility of carriers resulting in speed enhancement for transistors in CMOS technology. Traditionally, silicon straining is applied in a similar ad-h...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...