Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Many kernel learning methods have to assume parametric forms for the target kernel functions, which significantly limits the capability of kernels in fitting diverse patterns. Som...
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
Semistructured data is characterized by the lack of any fixed and rigid schema, although typically the data hassomeimplicitstructure. While thelack offixedschemamakesextracting ...