Previously-proposed strategies for VLSI fault diagnosis have su ered from a variety of self-imposed limitations. Some techniques are limited to a speci c fault model, and many wil...
David B. Lavo, Brian Chess, Tracy Larrabee, Ismed ...
This paper presents a probabilistic event-driven fault localization technique, which uses a probabilistic symptomfault map as a fault propagation model. The technique isolates the...
Abstract: A probabilistic event-driven fault localization technique is presented, which uses a symptom-fault map as a fault propagation model. The technique isolates the most proba...
Management of outer edge domains is a big challenge for service providers due to the diversity, heterogeneity and large amount of such networks, together with limited visibility on...
Pablo Arozarena, Raquel Toribio, Jesse Kielthy, Ke...
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...