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DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 3 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
ASPDAC
2007
ACM
14 years 29 days ago
2007
ACM
- Most image processing applications are computationally intensive and data intensive. Reconfigurable hardware boards provide a convenient and flexible solution to speed up these a...
WWW
2004
ACM
14 years 9 months ago
2004
ACM
The ability to determine what day-to-day activity (such as cooking pasta, taking a pill, or watching a video) a person is performing is of interest in many application domains. A ...
EDOC
2009
IEEE
14 years 25 days ago
2009
IEEE
A key challenge in devising solutions to a range of problems associated with business process management: process life cycle management, compliance management, enterprise process ...
DSN
2011
IEEE
12 years 8 months ago
2011
IEEE
— This paper describes a modeling framework for evaluating the impact of faults on the output of streaming ions. Our model is based on three abstractions: stream operators, strea...