51 search results - page 5 / 11 » Process Variation Tolerant 3T1D-Based Cache Architectures |
165
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DSN
2002
IEEE
16 years 1 days ago
2002
IEEE
The architecture and implementation of the LEON-FT processor is presented. LEON-FT is a fault-tolerant 32-bit processor based on the SPARC V8 instruction set. The processors toler...
176
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ISQED
2007
IEEE
16 years 1 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
225
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HPCA
2009
IEEE
16 years 7 months ago
2009
IEEE
Growing concerns about power have revived interest in in-order pipelines. In-order pipelines sacrifice single-thread performance. Specifically, they do not allow execution to flow...
165
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DAC
2009
ACM
16 years 8 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
252
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TC
2011
15 years 2 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...