51 search results - page 5 / 11 » Process Variation Tolerant 3T1D-Based Cache Architectures |
DSN
2002
IEEE
14 years 2 months ago
2002
IEEE
The architecture and implementation of the LEON-FT processor is presented. LEON-FT is a fault-tolerant 32-bit processor based on the SPARC V8 instruction set. The processors toler...
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
HPCA
2009
IEEE
14 years 10 months ago
2009
IEEE
Growing concerns about power have revived interest in in-order pipelines. In-order pipelines sacrifice single-thread performance. Specifically, they do not allow execution to flow...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
TC
2011
13 years 4 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...