129 search results - page 12 / 26 » Process Variations and their Impact on Circuit Operation |
JCP
2008
13 years 7 months ago
2008
Instability of SRAM memory cells derived from the process variation and lowered supply voltage has recently been posing significant design challenges for low power SoCs. This paper...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
DFT
2008
IEEE
13 years 9 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
SLIP
2009
ACM
14 years 1 months ago
2009
ACM
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...