129 search results - page 22 / 26 » Process Variations and their Impact on Circuit Operation |
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
TVLSI
2008
13 years 7 months ago
2008
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI des...
IEEESP
2008
13 years 7 months ago
2008
Today, critical infrastructures like the power grid are essentially physical processes controlled by computers connected by networks. They are usually as vulnerable as any other i...
CODES
2008
IEEE
14 years 1 months ago
2008
IEEE
Adaptive Body Biasing (ABB) is a popularly used technique to mitigate the increasing impact of manufacturing process variations on leakage power dissipation. The efficacy of the ...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...