122 search results - page 10 / 25 » Process variability-aware transient fault modeling and analy... |
SAFECOMP
2001
Springer
13 years 12 months ago
2001
Springer
This paper focuses on the development of a conceptual framework for integrating fault injection mechanisms into the RDD-100 tool2 to support the dependability analysis of computer...
ISPA
2004
Springer
14 years 28 days ago
2004
Springer
Abstract. Current solutions for fault-tolerance in HPC systems focus on dealing with the result of a failure. However, most are unable to handle runtime system configuration change...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
DIALM
2010
ACM
13 years 5 months ago
2010
ACM
We present a method for using real world mobility traces to identify tractable theoretical models for the study of distributed algorithms in mobile networks. We validate the metho...