122 search results - page 4 / 25 » Process variability-aware transient fault modeling and analy... |
DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
Decreasing hardware reliability is expected to impede the exploitation of increasing integration projected by Moore's Law. There is much ongoing research on efficient fault t...
MOBIHOC
2006
ACM
14 years 7 months ago
2006
ACM
Recent studies on mobility modeling have focused on characterizing user mobility from real traces of wireless LANs (WLANs) and creating mobility models based on such characterizat...
IPPS
2006
IEEE
14 years 1 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...