46 search results - page 4 / 10 » Process variation aware cache leakage management |
DAC
2009
ACM
14 years 9 months ago
2009
ACM
HPCA
2009
IEEE
14 years 3 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
CAL
2007
13 years 8 months ago
2007
—As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of process variations on critical path delay and chip yields have amplified. A com...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
ISCAS
2007
IEEE
14 years 2 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...