137 search results - page 4 / 28 » Process variation dimension reduction based on SVD |
ISBI
2004
IEEE
14 years 8 months ago
2004
IEEE
Ultrasound images are corrupted by a multiplicative noise, the speckle, which makes high level analysis difficult. Within each resolution cell a number of elementary scatterers re...
TVLSI
2010
13 years 2 months ago
2010
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
ICMLA
2008
13 years 9 months ago
2008
Dimension reduction techniques have been successfully applied to face recognition and text information retrieval. The process can be time-consuming when the data set is large. Thi...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
ICIP
2000
IEEE
14 years 9 months ago
2000
IEEE
This paper deals with the reduction of flicker in old films. This artifact appears as global, quick and random variations of the luminance and contrast between consecutive frames ...