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CORR
2008
Springer
84views Education» more  CORR 2008»
15 years 3 months ago
Efficiently Testing Sparse GF(2) Polynomials
We give the first algorithm that is both query-efficient and time-efficient for testing whether an unknown function f : {0, 1}n {-1, 1} is an s-sparse GF(2) polynomial versus -far ...
Ilias Diakonikolas, Homin K. Lee, Kevin Matulef, R...
MOC
2000
94views more  MOC 2000»
15 years 3 months ago
Irreducibility testing over local fields
The purpose of this paper is to describe a method to determine whether a bivariate polynomial with rational coefficients is irreducible when regarded as an element in Q((x))[y], th...
P. G. Walsh
STOC
2009
ACM
99views Algorithms» more  STOC 2009»
16 years 4 months ago
Testing juntas nearly optimally
A function on n variables is called a k-junta if it depends on at most k of its variables. In this article, we show that it is possible to test whether a function is a k-junta or ...
Eric Blais
DAC
2000
ACM
16 years 4 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
ATS
2005
IEEE
132views Hardware» more  ATS 2005»
15 years 9 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Vishwani D. Agrawal, Alok S. Doshi