- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
Jun-Fu Huang, Victor C. Y. Chang, Sally Liu, Kelvi...
Abstract. Software designs equipped with specification of dependability techniques can help engineers to develop critical systems. In this work, we start to envision how a softwar...
This paper presents a new register assignment heuristic for procedures in SSA Form, whose interference graphs are chordal; the heuristic is called optimistic chordal coloring (OCC...
This paper presents a new unified design flow developed within the Perplexus project that aims to accelerate parallelizable data-intensive applications in the context of ubiquitous...
Portable devices have more data storage and increasing communication capabilities everyday. In addition to classic infrastructure based communication, these devices can exploit hu...