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CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
15 years 6 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
DAC
2006
ACM
16 years 7 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
FMCAD
2009
Springer
16 years 23 days ago
Scaling VLSI design debugging with interpolation
—Given an erroneous design, functional verification returns an error trace exhibiting a mismatch between the specification and the implementation of a design. Automated design ...
Brian Keng, Andreas G. Veneris
GECCO
2006
Springer
188views Optimization» more  GECCO 2006»
15 years 10 months ago
Dynamic multi-objective optimization with evolutionary algorithms: a forward-looking approach
This work describes a forward-looking approach for the solution of dynamic (time-changing) problems using evolutionary algorithms. The main idea of the proposed method is to combi...
Iason Hatzakis, David Wallace
ISPW
1996
IEEE
15 years 10 months ago
Feedback, evolution and software technology
A 1968 study of the software process led, inter alia, to the observation that the software process constitutes a feedback system. Attempts at its management and improvement must t...
M. M. Lehman