1596 search results - page 78 / 320 » Quantum property testing |
METRICS
2003
IEEE
14 years 3 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
ICRA
1999
IEEE
14 years 2 months ago
1999
IEEE
Flexible parts feeding techniques have recently begun to gain industry acceptance. However, one barrier to effective flexible feeding solutions is a dearth of knowledge of the und...
ECCC
2000
13 years 9 months ago
2000
We consider testing graph expansion in the bounded-degree graph model. Specifically, we refer to algorithms for testing whether the graph has a second eigenvalue bounded above by a...
DFT
2004
IEEE
14 years 1 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
KBSE
2003
IEEE
14 years 3 months ago
2003
IEEE
Database application programs are often designed to be executed concurrently by many clients. By grouping related database queries into transactions, DBMS systems can guarantee th...