1596 search results - page 83 / 320 » Quantum property testing |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
CEC
2007
IEEE
14 years 4 months ago
2007
IEEE
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
HYBRID
2007
Springer
14 years 4 months ago
2007
Springer
Abstract. Testing is an important tool for validation of the system design and its implementation. Model-based test generation allows to systematically ascertain whether the system...
MTV
2006
IEEE
14 years 4 months ago
2006
IEEE
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...