403 search results - page 6 / 81 » Rationale and Design of BULK |
DL
1997
Springer
13 years 11 months ago
1997
Springer
MTA
2006
13 years 7 months ago
2006
AIEDAM
2000
13 years 7 months ago
2000
ISCAS
2002
IEEE
2002
IEEE
Latchup current self-stop circuit for whole-chip latchup prevention in bulk CMOS integrated circuits
14 years 13 days ago
A latchup current self-stop methodology and circuit design, which are used to prevent damage in the bulk CMOS integrated circuits due to latchup, are proposed in this paper. In a ...
ER
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. Neglecting traceability—i.e., the ability to describe and follow the life of a requirement—is known to entail misunderstanding and miscommunication, leading to the en...