107 search results - page 3 / 22 » Re-Examining the Use of Network-on-Chip as Test Access Mecha... |
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
CLEIEJ
2010
13 years 4 months ago
2010
Recent progress in ubiquitous computing technology is allowing development of new and sophisticated applications that are now able to store very large data on the mobile device it...
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
If access control policy decision points are not neatly separated from the business logic of a system, the evolution of a security policy likely leads to the necessity of changing...