Nanoelectronic devices are expected to have extremely high and variable fault rates; thus future processor architectures based on these unreliable devices need to be built with fa...
The probability that a failure will occur before the end of the computation increases as the number of processors used in a high performance computing application increases. For l...
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
Abstract— This paper focuses on the Delay/Fault-Tolerant Mobile Sensor Network (DFT-MSN) for pervasive information gathering. We develop simple and efficient data delivery schem...
There are currently two approaches to providing Byzantine-fault-tolerant state machine replication: a replica-based approach, e.g., BFT, that uses communication between replicas t...
James A. Cowling, Daniel S. Myers, Barbara Liskov,...