55 search results - page 3 / 11 » Reconfigurable scan chains: a novel approach to reduce test ... |
ITC
2002
IEEE
14 years 10 days ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
ITC
2002
IEEE
14 years 10 days ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
VTS
2002
IEEE
14 years 9 days ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...