55 search results - page 5 / 11 » Reconfigurable scan chains: a novel approach to reduce test ... |
ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
DELTA
2004
IEEE
13 years 11 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
ATS
1996
IEEE
13 years 11 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
Research on formulae production in spreadsheets has established the practice as high risk yet unrecognised as such by industry. There are numerous software applications that are d...
CEC
2010
IEEE
13 years 8 months ago
2010
IEEE
Learning Bayesian networks from data is an N-P hard problem with important practical applications. Several researchers have designed algorithms to overcome the computational comple...