201 search results - page 11 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
CONIELECOMP
2011
IEEE
12 years 11 months ago
2011
IEEE
This work focuses on developing systems of blocks in SIMULINK and VHDL to reuse on design of applications involving the recognition of polygonal objects. Usage of this work reduce...
DELTA
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes the concept, architecture, development and demonstration of a real time, high performance, software defined 4-receiver system and a space time decoder to be i...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
SOCIALCOM
2010
13 years 5 months ago
2010
As the value of reputation systems is widely recognized, the incentive to manipulate such systems is rapidly growing. We propose TAUCA, a scheme that identifies malicious users and...