201 search results - page 5 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
ITC
2002
IEEE
14 years 14 days ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...