552 search results - page 12 / 111 » Reducing Time Complexity in RFID Systems |
TSMC
2008
13 years 8 months ago
2008
Testing complex manufacturing systems, such as an ASML [1] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be execu...
ISCA
2010
IEEE
14 years 17 days ago
2010
IEEE
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...
ECCTD
2011
12 years 8 months ago
2011
Abstract—In this paper, a low complexity algorithm for the design of a time-varying correction filter of finite impulse response (FIR) type is presented. Using the obtained fi...
ISSS
1999
IEEE
14 years 16 days ago
1999
IEEE
In order to cope with the ever increasing complexity of todays application specific integrated circuits, a building block based design methodology is established. The system is co...
SUTC
2010
IEEE
14 years 3 days ago
2010
IEEE
—To maximize the communication throughput for wireless sensing systems, designers have attempted various combinations of protocol design and manual code optimization. Although th...