387 search results - page 14 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
DDECS
2009
IEEE
13 years 11 months ago
2009
IEEE
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
TIP
2010
13 years 2 months ago
2010
Multivariate image segmentation is a challenging task, influenced by large intraclass variation that reduces class distinguishability as well as increased feature space sparseness ...
ESSMAC
2003
Springer
14 years 23 days ago
2003
Springer
Abstract. While there is strong motivation for using Gaussian Processes (GPs) due to their excellent performance in regression and classification problems, their computational com...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...