387 search results - page 17 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
DAC
2005
ACM
14 years 8 months ago
2005
ACM
We propose a system architecture for real-time hardware speech recognition on low-cost, power-constrained devices. The system is intended to support real-time speech-based user in...
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper we present a cost-effective, high bandwidth server I/O network architecture, named PaScal (Parallel and Scalable). We use the PaScal server I/O network to support da...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
INFSOF
2007
13 years 7 months ago
2007
A set of mutation operators for SQL queries that retrieve information from a database is developed and tested against a set of queries drawn from the NIST SQL Conformance Test Sui...