387 search results - page 20 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
TOOLS
1998
IEEE
13 years 12 months ago
1998
IEEE
Object-orientation has rapidly become accepted as the preferred paradigm for large scale system design. There is considerable literature describing approaches to object-oriented d...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ICSM
2005
IEEE
14 years 1 months ago
2005
IEEE
Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software developm...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...