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» Reducing the Costs of Bounded-Exhaustive Testing
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DATE
2008
IEEE
174views Hardware» more  DATE 2008»
14 years 2 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...
DSN
2002
IEEE
14 years 18 days ago
Time-Constrained Failure Diagnosis in Distributed Embedded Systems
—Advanced automotive control applications such as steer-by-wire are typically implemented as distributed systems comprising many embedded processors, sensors, and actuators inter...
Nagarajan Kandasamy, John P. Hayes, Brian T. Murra...
ICTAI
1999
IEEE
13 years 12 months ago
Dynamic Email Organization via Relevance Categories
Many researchers have proposed classification systems that automatically classify email in order to reduce information overload. However, none of these systems are in use today. T...
Kenrick J. Mock
POPL
1994
ACM
13 years 11 months ago
Dominators, Super Blocks, and Program Coverage
In this paper we present techniques to nd subsets of nodes of a owgraph that satisfy the followingproperty: A test set that exercises all nodes in a subset exercises allnodes in t...
Hiralal Agrawal
RSS
2007
176views Robotics» more  RSS 2007»
13 years 9 months ago
Active Policy Learning for Robot Planning and Exploration under Uncertainty
Abstract— This paper proposes a simulation-based active policy learning algorithm for finite-horizon, partially-observed sequential decision processes. The algorithm is tested i...
Ruben Martinez-Cantin, Nando de Freitas, Arnaud Do...