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» Reducing the Frequent Pattern Set
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ITC
1991
IEEE
86views Hardware» more  ITC 1991»
13 years 11 months ago
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
F. Joel Ferguson, Tracy Larrabee
ATS
1998
IEEE
91views Hardware» more  ATS 1998»
14 years 9 days ago
Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunder...
ISMB
2000
13 years 9 months ago
Mining for Putative Regulatory Elements in the Yeast Genome Using Gene Expression Data
We have developed a set of methods and tools for automatic discovery of putative regulatory signals in genome sequences. The analysis pipeline consists of gene expression data clu...
Jaak Vilo, Alvis Brazma, Inge Jonassen, Alan J. Ro...
AI
2003
Springer
14 years 1 months ago
Efficient Mining of Indirect Associations Using HI-Mine
Discovering association rules is one of the important tasks in data mining. While most of the existing algorithms are developed for efficient mining of frequent patterns, it has be...
Qian Wan, Aijun An
JIIS
2006
124views more  JIIS 2006»
13 years 8 months ago
An efficient approach to mining indirect associations
Discovering association rules is one of the important tasks in data mining. While most of the existing algorithms are developed for efficient mining of frequent patterns, it has be...
Qian Wan, Aijun An