1182 search results - page 153 / 237 » Reducing the Overhead of Dynamic Analysis |
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
MICRO
2009
IEEE
14 years 3 months ago
2009
IEEE
With transistor miniaturization leading to an abundance of on-chip resources and uniprocessor designs providing diminishing returns, the industry has moved beyond single-core micr...
SRDS
2005
IEEE
14 years 2 months ago
2005
IEEE
Quorum protocols offer several benefits when used to maintain replicated data but techniques for reducing overheads associated with them have not been explored in detail. It is d...
VEE
2005
ACM
14 years 2 months ago
2005
ACM
Modern transactional response-time sensitive applications have run into practical limits on the size of garbage collected heaps. The heap can only grow until GC pauses exceed the ...
ASPLOS
2009
ACM
14 years 28 days ago
2009
ACM
Software systems are constantly changing. Patches to fix bugs and patches to add features are all too common. Every change risks breaking a previously working system. Hence admini...