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CN
2007
99views more  CN 2007»
13 years 11 months ago
Reducing the cost of applying adaptive test cases
The testing of a state-based system may involve the application of a number of adaptive test cases. Where the implementation under test (IUT) is deterministic, the response of the...
Robert M. Hierons, Hasan Ural
ICST
2009
IEEE
14 years 5 months ago
Transforming and Selecting Functional Test Cases for Security Policy Testing
In this paper, we consider typical applications in which the business logic is separated from the access control logic, implemented in an independent component, called the Policy ...
Tejeddine Mouelhi, Yves Le Traon, Benoit Baudry
ISSRE
2006
IEEE
14 years 4 months ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...
ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 5 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson