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» Reducing the cost of applying adaptive test cases
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SAC
2002
ACM
13 years 7 months ago
An evolutionary algorithm for reducing integrated-circuit test application time
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DATE
2009
IEEE
138views Hardware» more  DATE 2009»
14 years 2 months ago
Scalable Adaptive Scan (SAS)
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa
DATE
2010
IEEE
185views Hardware» more  DATE 2010»
14 years 14 days ago
Adapting to adaptive testing
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test conte...
Erik Jan Marinissen, Adit Singh, Dan Glotter, Marc...
CLEF
2010
Springer
13 years 8 months ago
MapReduce for Information Retrieval Evaluation: "Let's Quickly Test This on 12 TB of Data"
We propose to use MapReduce to quickly test new retrieval approaches on a cluster of machines by sequentially scanning all documents. We present a small case study in which we use ...
Djoerd Hiemstra, Claudia Hauff
IJCAI
2001
13 years 8 months ago
Using Case-Base Data to Learn Adaptation Knowledge for Design
One advantage of Case-Based Reasoning (CBR) is the relative ease of constructing and maintaining CBR systems, especially as a number of commercial CBR tools are available. However...
Jacek Jarmulak, Susan Craw, Ray Rowe