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» Refactoring Effect Estimation Based on Complexity Metrics
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DAC
2007
ACM
14 years 9 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ICCV
2005
IEEE
14 years 2 months ago
Visual Learning Given Sparse Data of Unknown Complexity
This study addresses the problem of unsupervised visual learning. It examines existing popular model order selection criteria before proposes two novel criteria for improving visu...
Tao Xiang, Shaogang Gong
SIGMOD
2004
ACM
199views Database» more  SIGMOD 2004»
14 years 8 months ago
Approximate XML Query Answers
The rapid adoption of XML as the standard for data representation and exchange foreshadows a massive increase in the amounts of XML data collected, maintained, and queried over th...
Neoklis Polyzotis, Minos N. Garofalakis, Yannis E....
IMC
2007
ACM
13 years 10 months ago
Compressed network monitoring for ip and all-optical networks
We address the problem of efficient end-to-end network monitoring of path metrics in communication networks. Our goal is to minimize the number of measurements or monitors requir...
Mark Coates, Yvan Pointurier, Michael Rabbat
ICCV
1999
IEEE
14 years 10 months ago
Illumination Distribution from Brightness in Shadows: Adaptive Estimation of Illumination Distribution with Unknown Reflectance
This paper describes a new method for estimating the illumination distribution of a real scene from a radiance distribution inside shadows cast by an object in the scene. First, t...
Imari Sato, Yoichi Sato, Katsushi Ikeuchi