This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
We present an improved data model that reflects the whole VLSI design process including bottom-up and topdown design phases. The kernel of the model is a static version concept th...
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
Ethnography has gained considerable prominence as a technique for informing CSCW systems development of the nature of work. Experiences of ethnography reported to date have focuse...
John A. Hughes, Val King, Tom Rodden, Hans Anderse...
In this paper, we carefully explore the assumptions behind using information capacity equivalence as a measure of correctness for judging transformed schemas in schema integration...