An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Abstract. We consider the problem of estimating vector-valued variables from noisy "relative" measurements. The measurement model can be expressed in terms of a graph, wh...
Prabir Barooah, Neimar Machado da Silva, Joã...
Multi-channel information systems involve data redundancy, which, in turn, requires the implementation of synchronization mechanisms among overlapping databases. This need for peri...
Cinzia Cappiello, Chiara Francalanci, Barbara Pern...
We design a linear time approximation scheme for the GaleBerlekamp Switching Game and generalize it to a wider class of dense fragile minimization problems including the Nearest C...