693 search results - page 129 / 139 » Reliability Mechanisms for Very Large Storage Systems |
TC
2010
13 years 6 months ago
2010
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...
LCN
2008
IEEE
14 years 2 months ago
2008
IEEE
Wireless Sensor Networks (WSNs) have received considerable attention in recent years and opened up new possibilities for various commercial and industrial applications. A WSN cons...
VEE
2012
ACM
12 years 3 months ago
2012
ACM
Dynamic Binary Translators (DBT) and Dynamic Binary Optimization (DBO) by software are used widely for several reasons including performance, design simplification and virtualiza...
ISSTA
2012
ACM
11 years 10 months ago
2012
ACM
Swarm testing is a novel and inexpensive way to improve the diversity of test cases generated during random testing. Increased diversity leads to improved coverage and fault detec...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...