Abstract. For large distributed systems built from inexpensive components, one expects to see incessant failures. This paper proposes two models for such faults and analyzes two we...
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
In this study we focus on the specification and assessment of Stochastic Petri net (SPN) models to evaluate the design of an embedded system for reliability and availability. The ...
Frederick T. Sheldon, Stefan Greiner, Matthias Ben...
High availability is an increasingly important requirement for enterprise systems, often valued more than performance. Systems designed for high availability typically use redunda...
Nidhi Aggarwal, Parthasarathy Ranganathan, Norman ...
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...