Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Many distributed software systems allow participation by large numbers of untrusted, potentially faulty components on an open network. As faults are inevitable in this setting, th...
Yuriy Brun, George Edwards, Jae Young Bang, Nenad ...
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of...
Subhasish Mitra, Nirmal R. Saxena, Edward J. McClu...
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...