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ICCAD
2000
IEEE
97views Hardware» more  ICCAD 2000»
13 years 12 months ago
Error Catch and Analysis for Semiconductor Memories Using March Tests
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
ISCA
2009
IEEE
136views Hardware» more  ISCA 2009»
14 years 2 months ago
ECMon: exposing cache events for monitoring
The advent of multicores has introduced new challenges for programmers to provide increased performance and software reliability. There has been significant interest in technique...
Vijay Nagarajan, Rajiv Gupta
ASPLOS
2006
ACM
14 years 1 months ago
Architectural support for software-based protection
Control-Flow Integrity (CFI) is a property that guarantees program control flow cannot be subverted by a malicious adversary, even if the adversary has complete control of data m...
Mihai Budiu, Úlfar Erlingsson, Martí...
DSN
2011
IEEE
12 years 7 months ago
LLS: Cooperative integration of wear-leveling and salvaging for PCM main memory
Phase change memory (PCM) has emerged as a promising technology for main memory due to many advan­ tages, such as better scalability, non-volatility and fast read access. However,...
Lei Jiang, Yu Du, Youtao Zhang, Bruce R. Childers,...
DFT
2007
IEEE
135views VLSI» more  DFT 2007»
14 years 1 months ago
Fault Secure Encoder and Decoder for Memory Applications
We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry....
Helia Naeimi, André DeHon