492 search results - page 54 / 99 » Reliability and Fault Tolerance in Trust |
SOSP
2009
ACM
14 years 5 months ago
2009
ACM
Hardware devices can fail, but many drivers assume they do not. When confronted with real devices that misbehave, these assumptions can lead to driver or system failures. While ma...
DAC
2012
ACM
11 years 11 months ago
2012
ACM
Much recent research [8, 6, 7] suggests significant power and energy benefits of relaxing correctness constraints in future processors. Such processors with relaxed constraints ...
GLVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
DAC
2003
ACM
14 years 9 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
DAC
2005
ACM
14 years 9 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...