Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...
Security and reliability issues in distributed systems have been investigated for several years at LAAS using a technique called Fragmentation-Redundancy-Scattering (FRS). The aim ...
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creat...
Dynamic error processing approaches are an important mechanism to increase the reliability in a multiprocessor system, while making efficient use of the available resources. To th...
Andrea Bondavalli, Silvano Chiaradonna, Felicita D...