291 search results - page 17 / 59 » Reliability estimation of a statistical classifier |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
BMVC
2000
13 years 10 months ago
2000
This paper addresses the problem of reconstructing surface models of indoor scenes from sparse 3D scene structure captured from N camera views. Sparse 3D measurements of real scen...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
BMCBI
2010
13 years 8 months ago
2010
Background: In many microarray experiments, analysis is severely hindered by a major difficulty: the small number of samples for which expression data has been measured. When one ...
ACL
2012
11 years 11 months ago
2012
We seek to automatically estimate typical durations for events and habits described in Twitter tweets. A corpus of more than 14 million tweets containing temporal duration informa...