291 search results - page 8 / 59 » Reliability estimation of a statistical classifier |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
MCS
2004
Springer
14 years 25 days ago
2004
Springer
Despite the good results provided by Dynamic Classifier Selection (DCS) mechanisms based on local accuracy in a large number of applications, the performances are still capable of ...
ICIP
2000
IEEE
14 years 9 months ago
2000
IEEE
In this paper we propose a new statistical model for SAR images. According to this model, the SAR image amplitude follows a product of Rayleigh and Bessel functions. We derive the...
MICCAI
2009
Springer
14 years 8 months ago
2009
Springer
Most state-of-the-art algorithms for filament detection in 3?D image-stacks rely on computing the Hessian matrix around individual pixels and labeling these pixels according to its...
BMCBI
2007
13 years 7 months ago
2007
Background: In many laboratory-based high throughput microarray experiments, there are very few replicates of gene expression levels. Thus, estimates of gene variances are inaccur...