282 search results - page 23 / 57 » Reliability- and process-variation aware design of integrate... |
JCP
2008
13 years 9 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Efficient system-level design is increasingly relying on hierarchical design-space exploration, as well as compositional methods, to shorten time-to-market, leverage design re-use...
ISPD
2004
ACM
14 years 2 months ago
2004
ACM
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
ISPD
2005
ACM
14 years 2 months ago
2005
ACM
In this paper, we develop a mixed-size placement tool, Dragon2005, to solve large scale placement problems effectively. A top-down hierarchical approach based on min-cut partition...
DAC
2004
ACM
14 years 10 months ago
2004
ACM
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...