282 search results - page 25 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2006
ACM
14 years 3 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
DAC
2011
ACM
12 years 8 months ago
2011
ACM
In this work, we propose an efficient and accurate full-chip thermomechanical stress and reliability analysis tool and design optimization methodology to alleviate mechanical rel...
DAC
2012
ACM
11 years 11 months ago
2012
ACM
In this work, we propose a fast and accurate chip/package thermomechanical stress and reliability co-analysis tool for TSV-based 3D ICs. We also present a design optimization meth...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective technique that provides real-time visibility to ...
IPPS
2002
IEEE
14 years 2 months ago
2002
IEEE
We propose a peer-to-peer Web document sharing technique, called “Browsers-Aware Proxy Server”. In this design, a proxy server connecting to a group of networked clients maint...