282 search results - page 27 / 57 » Reliability- and process-variation aware design of integrate... |
FPGA
2004
ACM
14 years 2 months ago
2004
ACM
We present the design of a high-performance, highly pipelined asynchronous FPGA. We describe a very fine-grain pipelined logic block and routing interconnect architecture, and sh...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
DAC
1994
ACM
14 years 1 months ago
1994
ACM
Higher levels of integration have led to a generation of integrated circuits for which power dissipation and reliability are major design concerns. In CMOS circuits, both of these ...
GLVLSI
2003
IEEE
14 years 2 months ago
2003
IEEE
Power-awareness indicates the scalability of the system energy with changing conditions and quality requirements. Multipliers are essential elements used in DSP applications and c...
HOST
2009
IEEE
13 years 6 months ago
2009
IEEE
Abstract-- We report our experiences in designing and implementing several hardware Trojans within the framework of the Embedded System Challenge competition that was held as part ...