282 search results - page 31 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2009
ACM
14 years 10 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
DAC
2003
ACM
14 years 2 months ago
2003
ACM
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
DAC
2003
ACM
14 years 2 months ago
2003
ACM
Reduction of an extracted netlist is an important pre-processing step for techniques such as model order reduction in the design and analysis of VLSI circuits. This paper describe...
CODES
2008
IEEE
14 years 3 months ago
2008
IEEE
Adaptive Body Biasing (ABB) is a popularly used technique to mitigate the increasing impact of manufacturing process variations on leakage power dissipation. The efficacy of the ...
TVLSI
2010
13 years 3 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...